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1. Course title

 Elemental Analysis by Ion Beams

2. Course code


Aikaisemmat leikkaavat opintojaksot 530113 Ion Beams in Materials Physics I, 5 op.

3. Course status: optional

-Which degree programme is responsible for the course?
Master's Programme in Materials Research

-Which module does the course belong to?
MATR300 Advanced Studies in Materials Research
optional for

  • Study Track in Experimental Materials Physics
  • Study Track in Inorganic Materials Chemistry

-Is the course available to students from other degree programmes?


4. Course level (first-, second-, third-cycle/EQF levels 6, 7 and 8)

Master’s level, degree programmes in medicine, dentistry and veterinary medicine = secondcycle
degree/EQF level 7
Doctoral level = third-cycle (doctoral) degree/EQF level 8

-Does the course belong to basic, intermediate or advanced studies (cf. Government Decree
on University Degrees)?
Advanced studies


5. Recommended time/stage of studies for completion

Can be taken in the early or later stages of studies.

6. Term/teaching period when the course will be offered

Given every second year (odd years) in the spring term.


7. Scope of the course in credits

5 cr

8. Teacher coordinating the course

Jyrki Räisänen

9. Course learning outcomes

The aim of the course is to provide a general description how ion beams are used in elemental analyses and to introduce the techniques at the practical level.

10. Course completion methods

Lectures, exercises, method demonstrations with data analysis reports, and final examination.

11. Prerequisites

No prior in-depth learning is required, but the following courses would provide useful background information: MATR316 Nuclear Physics I and MATR343 Microscope techniques in materials characterization.

12. Recommended optional studies

If you are interested in studying further the topic the course MATR314 Ion Beam Scattering Techniques for Materials Characterization is recommended.

13. Course content

Ion - matter interactions: basic concepts, slowing down

Introduction to electromagnetic radiation – matter interactions

Introduction to detectors and signal processing

Production of ion beams

Ion beam based elemental analyses techniques:  Particle-Induced X-ray Emission (PIXE), Particle-Induced Gamma-ray Emission (PIGE), Nuclear Reaction Analysis (NRA)/depth profiling of the light elements. Method applications.

Practical demonstrations of PIXE, PIGE and NRA (depth profiling).

14. Recommended and required literature

Lecture notes

Supplementary reading:

PIXE, A novel Technique for elemental analysis, S. A. E. Johansson, J. L. Campbell, John Wiley and Sons, 1988.

Particle-Induced X-Ray Emission Spectrometry (PIXE), S.A.E. Johansson,J.L. Campbell and K.G. Malmqvist, John Wiley and Sons, 1995.

Handbook of Modern Ion Beam Materials Analysis, Editors Y. Wang and M. Nastasi, MRS, 2009.

15. Activities and teaching methods in support of learning

Weekly lectures including several exercises (individual work). Practical demonstrations of the covered techniques comprising data analysis as individual work (with short report).

16. Assessment practices and criteria, grading scale

The final grade is based on an examination.


17. Teaching language


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